program

Day 1  |  Nov 13 (Wednesday), 2024
  • 9:00 - 9:30
    Registration
  • 9:30 - 9:40
    Opening Remarks
  • 9:40 - 10:15
    Session 1 + Q&A
    "Tomographic atomic force microscopy for materials research and failure analysis in the semiconductor industry of the post-nanometer era"
    - Prof. Umberto Celano
  • 10:15 - 10:50
    Session 2 + Q&A
    Dr. Vladimir Korolkov
  • 10:50 - 11:05
    Coffee Break
  • 11:05 - 11:40
    Session 3 + Q&A
    "Mapping Ions and Polarons at the Nanoscale with Photoinduced Force Microscopy (PiFM)"
    - Prof. Connor G. Bischak
  • 11:40 - 12:15
    Session 4 + Q&A
    Dr. Stefan Zollner 
  • 12:15 - 13:00
    Lunch
  • 13:00 - 13:35
    Session 5 + Q&A
    "Scanning Probe Microscopy Experiences in a Shared Resource Core Facility"
    - Dr. Brooke Beam Massani
  • 13:35 - 14:10
    Session 6 + Q&A
    "Charge-tansfer polarities in van der Waals heterojunctions"
    - Prof. Brian Kim
  • 14:10 - 14:25
    Coffee Break
  • 14:25 - 15:00
    Session 7 + Q&A
    Prof. Alex McLeod
  • 15:00 - 15:35
    Session 8 + Q&A
    "Advancements in PiFM: Method and Application Development for Semicondutor Metrology"
    - Dr. Komal Pandey
  • 15:35 - 15:50
    Coffee Break
    "Advances in the Analysis of 2D Transition Metal Dichalcogenides Using Scanning Probe Microscopy Techniques"
    - Dr. Albert Minj
  • 15:50 - 16:25
    Session 9 + Q&A
    "Advanced Microwave Impedeance Microscopy for Emerging Materials and Devices"
    - Prof. Eric Ma
  • 16:25 - 17:00
    Session 10 + Q&A
    "Advances in the Analysis of 2D Transition Metal Dichalcogenides Using Scanning Probe Microscopy Techniques"
    - Dr. Albert Minj
  • 17:00 - 18:30
    Poster Presentations
    Refreshment provided