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Advances and challenges in dynamic photo-induced force microscopy

장정훈 박사

한국표준과학연구원(KRISS)

Advances and challenges in dynamic photo-induced force microscopy

 

Junghoon Jahng*

 

Material Property Metrology Group, Korea Research Institute of Standards and Science, Daejeon, 34113, South Korea

*phyjjh@kriss.re.kr

 

 

Photo-induced force microscopy (PiFM) is a scanning probe technique celebrated for its capability to achieve high-resolution spectroscopic imaging at the nanoscale. This method exploits the amplification of tip motion by photo-induced forces, which arise from interactions with the local medium, ranging from induced dipole effects to thermal expansion. These force responses demonstrate complex behaviors linked to both far-field and near-field phenomena, depending on their spectroscopic origins. In this talk, a detailed overview of past research, emphasizing the technical challenges involved is provided. We present perspectives on photo-induced dipole and thermal forces, while also exploring the dynamic PiFM modes relevant to each case. This talk is intended for those new to the field, offering a balanced introduction that spans from theoretical principles to practical applications, covering both fundamental and advanced topics.

 

 

 

[1] “Photo-induced force microscopy (PiFM)–principles and implementations”, Chemical Society Reviews 51 (11), 4208-4222

[2] “Linear and nonlinear optical spectroscopy at the nanoscale with photoinduced force microscopy”, Accounts of chemical research 48 (10), 2671-2679