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The nanoscale lattice deformations in two-dimensional materials

김동현 박사

한양대학교 반도체나노광학연구실

E-mail

dong6882@gmail.com

The nanoscale lattice deformations in two-dimensional materials

Dong Hyeon Kim¹, Chanwoo Lee², Mun Seok Jeong^1,*

¹Hanyang University, ²Sungkyunkwan University

1Department of Physics, Hanyang University (222, Wangsimni-ro, Seongdong-gu, Seoul 04763 Korea)

mjeong@hanyang.ac.kr^*

Since the first discovery and application of two-dimensional materials as 2D transistors due to their extraordinary electrical and optical properties, the lattice deformations such as vacancies, substitutions, and strained regions have been widely researched to prevent and overcome the deterioration of the device performance. Moreover, the importance of defects is re-examined with two representative aspects: defect-induced performance degradation and defect engineering for new applications.

Tip-enhanced Raman spectroscopy (TERS) is the most suitable non-destructive method to investigate the nanoscale lattice deformations of two-dimensional materials with correlative information (topological and physicochemical). Using TERS, we have explored new lattice vibrations come from the transition metal and chalcogen vacancies, atomic substitutions/reconstructions at the interfaces of 2D heterostructures, and the changes of atomic spacing by inherent strain. [1-3]

Overall, our study highlights the importance of advanced nanoscale characterization to investigate and understand the lattice deformations for new challenges with low-dimensional materials.

Figure1. Tip-enhanced Raman spectroscopy for two-dimensional physical properties

[1] C. Lee, et al., ACS Nano 12 (2018) 9982-9990

[2] C. Lee, et al., npj 2D Materials and Applications 6 (2022) 67

[3] D. H. Kim, et al., Nanophotonics 12 (2024) 1069-1077

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