Smartscan User Reviews Of Park’S Newly Launched Automated Imaging System Smartscan Are Overwhelmingly Positive
- 07 Oct 2016
- Volume 5
- NanoScientific Magazine, Fall 2015
Initial Feedback from users of Park Systems SmartScan, the revolutionary point and click AFM nanoscopic tool is overwhelmingly positive, citing that SmartScan lets even inexperienced, untrained users produce high quality nanoscale imaging in five times the normal speed of a traditional AFM. After the launch of the new SmartScan software earlier this year, several users gave their response to the new software upgrade, which is now offered free of charge to all Park AFM users and will be installed on all future products.
“THE EVER SHRINKING NANOSCALE GEOMETRIES OF SEMICONDUCTOR DEVICES REQUIRE SOPHISTICATED FAILURE ANALYSIS TOOLS WHICH ARE THE TRADEMARK OF PARK SYSTEMS AFM,”
COMMENTED KEIBOCK LEE, PARK SYSTEMS PRESIDENT.
"Using SmartScan AFM by Park Systems is very easy, allowing me to take images of a sample at nanoscale resolution without the laborious manual set up. With SmartScan mode, the AFM automatically does the frequency sweep and intelligently decides on the best amplitude/frequency setting and the images are as impressive as if they were done by an expert AFM user, which makes my research even better. I am very happy that SmartScan is available." Jimmin Kim from Rutgers University.
“SmartScan offers great advantages to novice AFM users because it is so easy to produce a simple non-contact mode topography image,” comments Sibel Leblebici an opto electronic researcher at the Molecular Foundry of the Lawrence Berkeley National Laboratory where they use Park AFM equipment to explore the development of next generation light harvesting materials. “We rely heavily on the PinPoint scan mode for conductive AFM. The ability to see a representative approach-retract curve performed in the PinPoint mode makes it much easier to select parameters to perform a high quality conductive AFM measurement. The user interface in SmartScan is much easier to use because it is more intuitive and as a result, training new AFM users is much easier.”
“We are so impressed with SmartScan’s capabilities to enhance our research methodology because it eliminates the extensive training and time consuming operations required to obtain AFM images. Now, we are able to just think of what we need and in the next instant, the image is available, making our AFM analytical services easier and the AFM more fun to work with,” comments, Dr. Byungki Kim, a Park AFM user.
